A passive position-and pose-free current sensor

  • Weikang Xian
  • , Dong F. Wang
  • , Takeshi Kobayashi
  • , Ryutaro Maeda
  • , Toshihiro Itoh

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Cantilever based current sensor is attracting increasing attention recently because of its advantages like passiveness over other sensors and sequences of researches have been conducted. However, measurement error caused by position and pose errors is ignored in these researches. Although position and pose errors can be decreased by orientation and calibration generally, their negative influences on measurement accuracy remains. In this paper, position and pose errors are theoretically and experimentally considered for the first time to improve the measurement accuracy for cantilever based current sensors. A prototype is developed to verify of the proposed solution to the position and pose issue. Theoretical analysis and experimental results prove validity of the proposed position and pose free solution and measurement accuracy is improved greatly and measurement errors are decreased substantially from range of 3.04% to 57.4% to range of 0.11% to 27.9%. Generally, the solution can be applied to current sensors based on other principle improving their measurement accuracy with position and pose errors considered.

Original languageEnglish
Title of host publication2017 IEEE 12th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages29-33
Number of pages5
ISBN (Electronic)9781509030590
DOIs
StatePublished - 25 Aug 2017
Externally publishedYes
Event12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017 - Los Angeles, United States
Duration: 9 Apr 201712 Apr 2017

Publication series

Name2017 IEEE 12th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017

Conference

Conference12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017
Country/TerritoryUnited States
CityLos Angeles
Period9/04/1712/04/17

Keywords

  • cantilever array
  • high accuracy
  • position and pose free

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