TY - JOUR
T1 - A novel envelope inversion method with frequency selection mechanism
AU - Gao, Zhaoqi
AU - Pan, Zhibin
AU - Gao, Jinghuai
AU - Wu, Ru shan
N1 - Publisher Copyright:
© 2016 SEG.
PY - 2016
Y1 - 2016
N2 - An accurate initial model is crucial for full waveform inversion (FWI). Envelope inversion (EI) is a powerful method for recovering long-wavelength components of the subsurface structure and building an initial model for FWI. In this paper, we improve EI by embedding a frequency selection mechanism into it. We propose a frequency selected envelope operator (FSEO) and compare its feature with envelope operator (EO) by applying them to the waveform. We develop a new inversion method by defining a misfit function based on the FSEO and deriving the corresponding gradient operator. Numerical results using synthetic data from the Marmousi model demonstrate that compared with EI, our proposed method is less sensitive to the initial model and can build an initial model with more accurate long-wavelength components that then significantly benefit the final results of conventional FWI.
AB - An accurate initial model is crucial for full waveform inversion (FWI). Envelope inversion (EI) is a powerful method for recovering long-wavelength components of the subsurface structure and building an initial model for FWI. In this paper, we improve EI by embedding a frequency selection mechanism into it. We propose a frequency selected envelope operator (FSEO) and compare its feature with envelope operator (EO) by applying them to the waveform. We develop a new inversion method by defining a misfit function based on the FSEO and deriving the corresponding gradient operator. Numerical results using synthetic data from the Marmousi model demonstrate that compared with EI, our proposed method is less sensitive to the initial model and can build an initial model with more accurate long-wavelength components that then significantly benefit the final results of conventional FWI.
UR - https://www.scopus.com/pages/publications/85019150360
U2 - 10.1190/segam2016-13855402.1
DO - 10.1190/segam2016-13855402.1
M3 - 会议文章
AN - SCOPUS:85019150360
SN - 1052-3812
VL - 35
SP - 1374
EP - 1379
JO - SEG Technical Program Expanded Abstracts
JF - SEG Technical Program Expanded Abstracts
T2 - SEG International Exposition and 86th Annual Meeting, SEG 2016
Y2 - 16 October 2011 through 21 October 2011
ER -