TY - GEN
T1 - A Non-scanning Reflection Technique (NRT) for measurements of optical nonlinearities
AU - Zhang, Lin
AU - Ren, Huan
AU - Yang, Yi
AU - Yuan, Quan
AU - Liu, Yong
AU - Shi, Zhendong
AU - Ma, Hua
AU - Chen, Bo
AU - Mu, Tingkui
N1 - Publisher Copyright:
© 2015 SPIE.
PY - 2015
Y1 - 2015
N2 - Reflection Z-scan technique allows the measurements of optical nonlinearities of highly absorbing media and surface of transparent media, when transmission Z-scan can not be used. However, Reflection Z-scan needs multiple measurements under strong laser pulse excitation in the scanning process. This can induce damage in the sample in some cases. In this paper, a Non-scanning Reflection Technique (NRT) for measurement of optical nonlinearities is presented to overcome this drawback. Both the nonlinear refraction index and nonlinear absorption coefficient can be determined by measuring the reflection in combination of variable attenuator and an aperture. Based on the Fresnel theory, a theoretical analysis of Non-scanning Reflection Technique (NRT) demonstrates the feasibility of this approach is given and a general expression for the normalized reflectance is derived. In order to illustrate our analytical results, we performed a numerical simulation of the normalized reflectance. Besides, retardance and size of the induced phase plate also make contributions to the normalized reflectance. Moreover, this technique shows a higher sensitivity property compared with traditional reflection Z-scan method.
AB - Reflection Z-scan technique allows the measurements of optical nonlinearities of highly absorbing media and surface of transparent media, when transmission Z-scan can not be used. However, Reflection Z-scan needs multiple measurements under strong laser pulse excitation in the scanning process. This can induce damage in the sample in some cases. In this paper, a Non-scanning Reflection Technique (NRT) for measurement of optical nonlinearities is presented to overcome this drawback. Both the nonlinear refraction index and nonlinear absorption coefficient can be determined by measuring the reflection in combination of variable attenuator and an aperture. Based on the Fresnel theory, a theoretical analysis of Non-scanning Reflection Technique (NRT) demonstrates the feasibility of this approach is given and a general expression for the normalized reflectance is derived. In order to illustrate our analytical results, we performed a numerical simulation of the normalized reflectance. Besides, retardance and size of the induced phase plate also make contributions to the normalized reflectance. Moreover, this technique shows a higher sensitivity property compared with traditional reflection Z-scan method.
KW - Non-scanning Reflection Technique (NRT)
KW - higher sensitivity property
KW - normalized reflectance
KW - optical nonlinearities
KW - phase plate
KW - reflection Z-scan
KW - strong laser pulse excitation
UR - https://www.scopus.com/pages/publications/84954054441
U2 - 10.1117/12.2184525
DO - 10.1117/12.2184525
M3 - 会议稿件
AN - SCOPUS:84954054441
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Optical Measurement Systems for Industrial Inspection IX
A2 - Albertazzi G., Armando
A2 - Lehmann, Peter
A2 - Osten, Wolfgang
PB - SPIE
T2 - Optical Measurement Systems for Industrial Inspection IX
Y2 - 22 June 2015 through 25 June 2015
ER -