A new trapped mode caused by local defect or thermal inhomogeneity

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The trapped modes, widely used in resonators, filters, quartz crystal microbalance, and other wave devices, are usually excited by attaching a partially mass layer or electrode on the surface of a plate. A new thickness-twist trapped mode in a transversely piezoelectric plate with a defect or local inhomogeneous temperature in it has been obtained by using of power series expansion method. Numerical results obtained indicate that trapped modes exist in such a damaged or thermal plate, which can not be observed when the plate is homogeneous. The finding of energy trapping phenomenon provides a new style for the excitation of trapped waves.

Original languageEnglish
Title of host publicationProceedings of the 2013 Symposium on Piezoelectricity, Acoustic Waves and Device Applications, SPAWDA 2013
PublisherIEEE Computer Society
ISBN (Print)9781479932894
DOIs
StatePublished - 2013
Event2013 Symposium on Piezoelectricity, Acoustic Waves and Device Applications, SPAWDA 2013 - Changsha, China
Duration: 25 Oct 201327 Oct 2013

Publication series

NameProceedings of the 2013 Symposium on Piezoelectricity, Acoustic Waves and Device Applications, SPAWDA 2013

Conference

Conference2013 Symposium on Piezoelectricity, Acoustic Waves and Device Applications, SPAWDA 2013
Country/TerritoryChina
CityChangsha
Period25/10/1327/10/13

Keywords

  • Energy trapping
  • Piezoelectric damage
  • Power series expansion
  • Thickness-twist waves

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