Abstract
A new temperature stable microwave dielectric with low-firing temperature in xBi2MoO6-(1 - x)TiO2 system was prepared by conventional solid state reaction method. The crystalline phases, sintering behavior, microwave dielectric properties of xBi2MoO6-(1 - x)TiO2 ceramics were studied. All the xBi2MoO6-(1 - x)TiO2 ceramics could be well sintered at 850 °C for 3 h. X-ray diffraction analysis showed that tetragonal rutile phase and monoclinic Bi2MoO6 phase coexisted in the ceramic. The permittivity εr changed from 77.5 to 33.5 and the temperature coefficient of resonant frequency τf value shifted from +348.1 to -37.8 ppm/°C as the x value increased from 0.06 to 0.65. The temperature stable microwave dielectric ceramic was obtained when x = 0.57 in the xBi2MoO6-(1 - x)TiO2 system, and it showed excellent dielectric properties of εr = 36.7, Qf = 16,800 GHz and τf = 0 ppm/°C. Crown
| Original language | English |
|---|---|
| Pages (from-to) | 626-629 |
| Number of pages | 4 |
| Journal | Journal of Alloys and Compounds |
| Volume | 493 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - 18 Mar 2010 |
| Externally published | Yes |
Keywords
- LTCC
- Microwave dielectric
- xBiMoO-(1 - x)TiO