TY - JOUR
T1 - A method to process the row-noise in image of near-field optical scanning microscopy
AU - Dang, Qun
AU - Bai, Yonglin
AU - Zhang, Gongli
AU - Hou, Xun
PY - 2000
Y1 - 2000
N2 - In the system with a mode of scanning, such as the near-field optical scanning microscopy, the image produced has big row-noise due to many kinds of reasons. In this case, the traditional methods, like average and Fourier filter, are not good at eliminating the row-noise. Two new methods, adaptive iterative and wavelet analysis, are proposed in this article. Wavelet-analysis is able to be localized in the time-frequency domain, and its window of time and frequency can be adjusted, therefore, the row-noise is able to be detected and Location of the noise can be realized. These processes prove to be effective in experiments.
AB - In the system with a mode of scanning, such as the near-field optical scanning microscopy, the image produced has big row-noise due to many kinds of reasons. In this case, the traditional methods, like average and Fourier filter, are not good at eliminating the row-noise. Two new methods, adaptive iterative and wavelet analysis, are proposed in this article. Wavelet-analysis is able to be localized in the time-frequency domain, and its window of time and frequency can be adjusted, therefore, the row-noise is able to be detected and Location of the noise can be realized. These processes prove to be effective in experiments.
KW - Row-nose
KW - Self-adapt
KW - Wavelet-analysis
UR - https://www.scopus.com/pages/publications/71149107687
M3 - 文章
AN - SCOPUS:71149107687
SN - 1004-4213
VL - 29
SP - 748
EP - 751
JO - Guangzi Xuebao/Acta Photonica Sinica
JF - Guangzi Xuebao/Acta Photonica Sinica
IS - 8
ER -