A maximum in ductility and fracture toughness in nanostructured Cu/Cr multilayer films

J. Y. Zhang; G. Liu; X. Zhang; G. J. Zhang; J. Sun; E. Ma

doi:10.1016/j.scriptamat.2009.10.030

A maximum in ductility and fracture toughness in nanostructured Cu/Cr multilayer films

J. Y. Zhang
, G. Liu
, X. Zhang
, G. J. Zhang
, J. Sun
, E. Ma

School of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

74 Scopus citations

Abstract

In Cu/Cr multilayers with modulation period (λ) ranging from 10 to 250 nm, maxima are observed for both tensile ductility and fracture at a critical λ ∼ 50 nm, different from the monotonic λ dependence known for monolithic films. This unusual behavior is explained, via quantitative assessments based on a micromechanical model, by considering the competing thickness effects on the size of the microcracks initiated in the Cr layers and on the role of the ductile Cu layer in blocking crack propagation.

Original language	English
Pages (from-to)	333-336
Number of pages	4
Journal	Scripta Materialia
Volume	62
Issue number	6
DOIs	https://doi.org/10.1016/j.scriptamat.2009.10.030
State	Published - Mar 2010

Keywords

Ductility
Nanostructured multilayers
Size effect
Toughness

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10.1016/j.scriptamat.2009.10.030

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title = "A maximum in ductility and fracture toughness in nanostructured Cu/Cr multilayer films",

abstract = "In Cu/Cr multilayers with modulation period (λ) ranging from 10 to 250 nm, maxima are observed for both tensile ductility and fracture at a critical λ ∼ 50 nm, different from the monotonic λ dependence known for monolithic films. This unusual behavior is explained, via quantitative assessments based on a micromechanical model, by considering the competing thickness effects on the size of the microcracks initiated in the Cr layers and on the role of the ductile Cu layer in blocking crack propagation.",

keywords = "Ductility, Nanostructured multilayers, Size effect, Toughness",

author = "Zhang, \{J. Y.\} and G. Liu and X. Zhang and Zhang, \{G. J.\} and J. Sun and E. Ma",

year = "2010",

month = mar,

doi = "10.1016/j.scriptamat.2009.10.030",

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volume = "62",

pages = "333--336",

journal = "Scripta Materialia",

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TY - JOUR

T1 - A maximum in ductility and fracture toughness in nanostructured Cu/Cr multilayer films

AU - Zhang, J. Y.

AU - Liu, G.

AU - Zhang, X.

AU - Zhang, G. J.

AU - Sun, J.

AU - Ma, E.

PY - 2010/3

Y1 - 2010/3

N2 - In Cu/Cr multilayers with modulation period (λ) ranging from 10 to 250 nm, maxima are observed for both tensile ductility and fracture at a critical λ ∼ 50 nm, different from the monotonic λ dependence known for monolithic films. This unusual behavior is explained, via quantitative assessments based on a micromechanical model, by considering the competing thickness effects on the size of the microcracks initiated in the Cr layers and on the role of the ductile Cu layer in blocking crack propagation.

AB - In Cu/Cr multilayers with modulation period (λ) ranging from 10 to 250 nm, maxima are observed for both tensile ductility and fracture at a critical λ ∼ 50 nm, different from the monotonic λ dependence known for monolithic films. This unusual behavior is explained, via quantitative assessments based on a micromechanical model, by considering the competing thickness effects on the size of the microcracks initiated in the Cr layers and on the role of the ductile Cu layer in blocking crack propagation.

KW - Ductility

KW - Nanostructured multilayers

KW - Size effect

KW - Toughness

UR - https://www.scopus.com/pages/publications/73549114682

U2 - 10.1016/j.scriptamat.2009.10.030

DO - 10.1016/j.scriptamat.2009.10.030

M3 - 文章

AN - SCOPUS:73549114682

SN - 1359-6462

VL - 62

SP - 333

EP - 336

JO - Scripta Materialia

JF - Scripta Materialia

IS - 6

ER -

A maximum in ductility and fracture toughness in nanostructured Cu/Cr multilayer films

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Keywords

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