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A high resolution tilt measurement system based on multi-accelerometers

  • Yinsheng Weng
  • , Shudong Wang
  • , Hongcai Zhang
  • , Hairong Gu
  • , Xueyong Wei
  • Xi'an Jiaotong University
  • Chang'an University

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

In this paper, a wireless tilt measurement system of high resolution is proposed and demonstrated using multiple MEMS (Micro-electromechanical Systems) accelerometers. The measurement system is mainly composed of MEMS accelerometers as sensing unit, a MCU (Micro Controller Unit), wireless transceivers, battery and a PC terminal. Three MEMS accelerometers are purposely located with specific orientations and the system output is determined from the accelerometer that is most sensitive in the tilting range of the object under testing. The raw measured signal collected by the MCU is processed using Kalman Filter (KF) and the analyzed data is transmitted to the PC terminal by a wireless module. The effect of different KF parameters are analyzed using the Allan variance. After eliminating the accelerometers’ installation errors, the measuring resolution of system is found to be 0.02° in the whole range from 0° to 360°. In the step test of tilting back and forth, it is found that the absolute measurement error is less than 0.004° for the step change of 0.05°.

Original languageEnglish
Pages (from-to)215-222
Number of pages8
JournalMeasurement: Journal of the International Measurement Confederation
Volume109
DOIs
StatePublished - Oct 2017

Keywords

  • Accelerometer
  • Allan variance
  • Kalman filter
  • Tilt measurement

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