@inproceedings{2b1cd8cc513148629085b2c64a224cba,
title = "A dual-path open-loop CMOS slew-rate controlled output driver with low PVT variation",
abstract = "A dual-path open-loop slew-rate controlled CMOS driver is presented. The proposed output driver incorporates a delay-locked loop (DLL) to minimize the slew-rate variation over process, voltage and temperature (PVT). A dual-path open-loop structure is introduced to cancel the high-frequency components of the output signal. Simulation using the Global Foundry 0.18µm CMOS process shows that the driver achieves less than 0.66V/ns slew-rate variation operating at 500 Mbps over 16 corners, corresponding to 56\% reduction compared with that of a conventional output driver.",
keywords = "DLL, EM radiation, Output driver, Slew rate control",
author = "Xiaoyan Gui and Kai Li and Xiaoli Wang and Li Geng",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE; 61st IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2018 ; Conference date: 05-08-2018 Through 08-08-2018",
year = "2018",
month = jul,
day = "2",
doi = "10.1109/MWSCAS.2018.8623982",
language = "英语",
series = "Midwest Symposium on Circuits and Systems",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "274--277",
booktitle = "2018 IEEE 61st International Midwest Symposium on Circuits and Systems, MWSCAS 2018",
}