A crater shape nano-crack for surface conduction electron emitters

Bangdao Chen; Hongzhong Liu; Weihua Liu; Xin Li; Yucheng Ding; Bingheng Lu

doi:10.1109/IVNC.2012.6316903

A crater shape nano-crack for surface conduction electron emitters

Bangdao Chen
, Hongzhong Liu
, Weihua Liu
, Xin Li
, Yucheng Ding
, Bingheng Lu

School of Mechanical Engineering

Xi'an Jiaotong University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Thermal stress in multilayer thin films during a heating or freezing process can be employed to form different morphologies: wrinkles, buckles, and cracks. In this paper, a simple process based on above method is explored to induce nano-crack, which could be used as an excellent electron tunneling channel for surface conduction electron-emitter (SCE). The crack position is uplift by the buckling and delaminating process, and the crack size is controlled by the freezing temperature. Compared with the conventional two-dimensional SCE, the crater shape SCE constrained the electron trajectory, which led higher emission current and lower turn-on voltage.

Original language	English
Title of host publication	Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012Om
Pages	200-202
Number of pages	3
DOIs	https://doi.org/10.1109/IVNC.2012.6316903
State	Published - 2012
Event	25th International Vacuum Nanoelectronics Conference, IVNC 2012 - Jeju, Korea, Republic of Duration: 9 Jul 2012 → 13 Jul 2012

Publication series

Name	Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012

Conference

Conference	25th International Vacuum Nanoelectronics Conference, IVNC 2012
Country/Territory	Korea, Republic of
City	Jeju
Period	9/07/12 → 13/07/12

Keywords

Crater Shape
Nano-crack
Surface Conduction Electron Emitters

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10.1109/IVNC.2012.6316903

Cite this

Chen, B., Liu, H., Liu, W., Li, X., Ding, Y., & Lu, B. (2012). A crater shape nano-crack for surface conduction electron emitters. In Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012Om (pp. 200-202). Article 6316903 (Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012). https://doi.org/10.1109/IVNC.2012.6316903

@inproceedings{c10800c94b064eb39a45d9fb9d7eb00e,

title = "A crater shape nano-crack for surface conduction electron emitters",

abstract = "Thermal stress in multilayer thin films during a heating or freezing process can be employed to form different morphologies: wrinkles, buckles, and cracks. In this paper, a simple process based on above method is explored to induce nano-crack, which could be used as an excellent electron tunneling channel for surface conduction electron-emitter (SCE). The crack position is uplift by the buckling and delaminating process, and the crack size is controlled by the freezing temperature. Compared with the conventional two-dimensional SCE, the crater shape SCE constrained the electron trajectory, which led higher emission current and lower turn-on voltage.",

keywords = "Crater Shape, Nano-crack, Surface Conduction Electron Emitters",

author = "Bangdao Chen and Hongzhong Liu and Weihua Liu and Xin Li and Yucheng Ding and Bingheng Lu",

year = "2012",

doi = "10.1109/IVNC.2012.6316903",

language = "英语",

isbn = "9781467319812",

series = "Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012",

pages = "200--202",

booktitle = "Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012Om",

note = "25th International Vacuum Nanoelectronics Conference, IVNC 2012 ; Conference date: 09-07-2012 Through 13-07-2012",

}

Chen, B, Liu, H, Liu, W, Li, X, Ding, Y & Lu, B 2012, A crater shape nano-crack for surface conduction electron emitters. in Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012Om., 6316903, Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012, pp. 200-202, 25th International Vacuum Nanoelectronics Conference, IVNC 2012, Jeju, Korea, Republic of, 9/07/12. https://doi.org/10.1109/IVNC.2012.6316903

A crater shape nano-crack for surface conduction electron emitters. / Chen, Bangdao; Liu, Hongzhong; Liu, Weihua et al.
Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012Om. 2012. p. 200-202 6316903 (Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A crater shape nano-crack for surface conduction electron emitters

AU - Chen, Bangdao

AU - Liu, Hongzhong

AU - Liu, Weihua

AU - Li, Xin

AU - Ding, Yucheng

AU - Lu, Bingheng

PY - 2012

Y1 - 2012

N2 - Thermal stress in multilayer thin films during a heating or freezing process can be employed to form different morphologies: wrinkles, buckles, and cracks. In this paper, a simple process based on above method is explored to induce nano-crack, which could be used as an excellent electron tunneling channel for surface conduction electron-emitter (SCE). The crack position is uplift by the buckling and delaminating process, and the crack size is controlled by the freezing temperature. Compared with the conventional two-dimensional SCE, the crater shape SCE constrained the electron trajectory, which led higher emission current and lower turn-on voltage.

AB - Thermal stress in multilayer thin films during a heating or freezing process can be employed to form different morphologies: wrinkles, buckles, and cracks. In this paper, a simple process based on above method is explored to induce nano-crack, which could be used as an excellent electron tunneling channel for surface conduction electron-emitter (SCE). The crack position is uplift by the buckling and delaminating process, and the crack size is controlled by the freezing temperature. Compared with the conventional two-dimensional SCE, the crater shape SCE constrained the electron trajectory, which led higher emission current and lower turn-on voltage.

KW - Crater Shape

KW - Nano-crack

KW - Surface Conduction Electron Emitters

UR - https://www.scopus.com/pages/publications/84869043217

U2 - 10.1109/IVNC.2012.6316903

DO - 10.1109/IVNC.2012.6316903

M3 - 会议稿件

AN - SCOPUS:84869043217

SN - 9781467319812

T3 - Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012

SP - 200

EP - 202

BT - Technical Digest - 25th International Vacuum Nanoelectronics Conference, IVNC 2012Om

T2 - 25th International Vacuum Nanoelectronics Conference, IVNC 2012

Y2 - 9 July 2012 through 13 July 2012

ER -

A crater shape nano-crack for surface conduction electron emitters

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