宽禁带半导体 X 射线探测器研究进展

Translated title of the contribution: Development of X-ray Detectors Based on Wide-bandgap Semiconductor
  • Xuan Wu
  • , Runlong Gao
  • , Zhiyu Liu
  • , Xiangli Zhong
  • , Linyue Liu
  • , Xiaoping Ouyang

Research output: Contribution to journalArticlepeer-review

Abstract

High-performance semiconductor X-ray detectors prefer outstanding characteristics including low detec⁃ tion of limit,low dark current,high sensitivity,fast response time,high radiation hardness and so on. Wide-band⁃ gap semiconductors such as silicon carbide(SiC),gallium nitride(GaN),diamond,gallium oxide(Ga2O3),and zinc oxide(ZnO)exhibit exceptional properties,including a wide bandgap,high electron mobility,high breakdown field strength,high saturated carrier drift velocity,and large displacement energy. These characteristics enable them to demonstrate superior performance in X-ray detection,meeting the requirements for high-performance semiconduc⁃ tor X-ray detectors and making them highly promising candidates for such applications. As a result,they have emerged as promising candidates for advanced X-ray detectors. In this paper,the electrical properties,preparation technology and detection performance of SiC,GaN,diamond,Ga2O3,ZnO X-ray detectors are introduced,and the latest research is discussed. Meanwhile,future research directions and potential applications of wide-bandgap semi⁃ conductor X-ray detectors in medical imaging,industrial detection and space exploration conduct in-deep thinking.

Translated title of the contributionDevelopment of X-ray Detectors Based on Wide-bandgap Semiconductor
Original languageChinese (Traditional)
Pages (from-to)794-812
Number of pages19
JournalFaguang Xuebao/Chinese Journal of Luminescence
Volume46
Issue number5
DOIs
StatePublished - May 2025
Externally publishedYes

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