大容量电力电子装备关键器件及系统可靠性综合分析与评估方法综述

The comprehensive reliability analysis and evaluation method are vital to the optimal design of large capacity power electronic equipment, but its core problem has not been solved. Through the analysis of the physical failure mechanism of a device, different failure modes of various key devices can be obtained. In accordance with the theoretical basis of reliability research under the coupling of multi-physical fields, the reliability evaluation can be carried out more accurately for specific devices, systems, and physical fields under different time scales. We introduced the reliability research status of power semiconductor devices, capacitors and equipment, and analyzed the physical mechanism of device failure and reliability analysis methods. Summarizing the existing research problems, we proposed the corresponding solutions, and pointed out the future research direction of the reliability of large capacity power electronic equipment.