Abstract
Defect detection is an important part of intelligent manufacturing system. When traditional machine learning algorithms are used for defect classification, data noise interference is usually encountered, which reduces the algorithm's prediction accuracy for defect classification. Although powerful algorithms such as Robust Linear Discriminant Analysis (RLDA) have been proposed in recent years to solve classification problems with data disturbed by sparse noise, there are still some drawbacks that limit its application performance. In this paper, a new Optimal Mean-Robust Linear Classification Analyis (OMRLSA) based on linear discriminant analysis is proposed. Different from the previous classification methods dealing with noisy data, ignoring the influence of the Laplace distribution characteristic of sparse noise on the data mean, the optimal mean robust linear classification model proposed in this paper will automatically update the optimal mean of the data. This ensures that the statistical characteristics of the data will not be disturbed by noise. Furthermore, a weighted kernel norm minimization method with joint L2,1 norm minimization and rank compression on regularization and error measurement is introduced for the first time in a robust classification model in the subsequent loss function. Thereby the robustness of the algorithm is improved. Experimental results on standard dataset with different ratio corruption illustrate the superiority of the proposed method.
| Translated title of the contribution | Optimal Mean Linear Classifier via Weighted Nuclear Norm and L2,1 Norm |
|---|---|
| Original language | Chinese (Traditional) |
| Pages (from-to) | 1602-1609 |
| Number of pages | 8 |
| Journal | Dianzi Yu Xinxi Xuebao/Journal of Electronics and Information Technology |
| Volume | 44 |
| Issue number | 5 |
| DOIs | |
| State | Published - May 2022 |
| Externally published | Yes |
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